Practical XHV Electron Gun

Practical experiences with electron gun charge-compensation during SIMS-analysis

Electrical charging during SIMS-analysis (secondary ion mass spectrometry) is a severe limitation for the analysis of non-conductive samples. In most cases this charging can be compensated with the aid of an electron gun. This is an already established method to analyze insulating samples. In this work results of a systematic study of electron gun charge compensation in our CAMECA ims5f ion mic...

Electron Gun Technology

Wisconsin Srf Electron Gun Commissioning*

The University of Wisconsin-Madison has completed installation of a superconducting electron gun. Its concept was optimized to be the source for a CW free electron laser facility with multiple megahertz repetition rate end stations. This VHF superconducting configuration holds the promise of the highest performance for CW injectors. Initial commissioning efforts show that the cavity can achieve...

Hybrid dc–ac electron gun for fs-electron pulse generation

We present a new concept of an electron gun for generating subrelativistic few-femtosecond (fs) electron pulses. The basic idea is to utilize a dc acceleration stage combined with an RF cavity, the ac field of which generates an electron energy chirp for bunching at the target. To reduce space charge (SC) broadening the number of electrons in the bunch is reduced and the gun is operated at a me...

Nanotip electron gun for the scanning electron microscope.

Experimental nanotips have shown significant improvement in the resolution performance of a cold field emission scanning electron microscope (SEM). Nanotip electron sources are very sharp electron emitter tips used as a replacement for the conventional tungsten field emission (FE) electron sources. Nanotips offer higher brightness and smaller electron source size. An electron microscope equippe...